Collect, edit, analyze and visualize the information obtained in the process of measuring the physical parameters of semiconductor wafers by processing all information in the suite providing options for quick editing and sorting based on the type of data. Ellipsometers, thickness gauges, and four-point probes are available.
WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
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