WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
It can batch extract text from JPEG JPG image and convert it into editable Word.
It is a neat app that helps you analyze and validate 3D fluorescence images.
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